| The Distribution of Chemical Elements in Al- or La-capped High-k Metal Gate (HK-MG) Stacks |
M Bosman (IME/IMRE), Y Zhang, C K Cheng, X Li (IME/NTU), X Wu (IME/NTU), K L Pey (NTU), C T Lin (UMC), Y W Chen (UMC), S H Hsu (UMC) and C H Hsu (UMC) |
Applied Physcis Letters. Published in 97, 103504 (2010) |
| Design and Fabrication of a Reliability Test Chip for 3D-TSV |
A D Trigg, Li Hong Yu, Zhang Xiaowu, Chai Tai Chong, Cheng Cheng Kuo< Navas Khan and Yu Daquan |
Electronic Components and Technology Conference (ECTC), 1 - 4 June 2010, Las Vegas, USA. Published pages 79 - 83. |
| Direct Visualization and In-Depth Physical Study of Metal Filament Formation in Percolated High-k Dielectrics |
X Li (NTU/IME), K L Pey (NTU), M Bosman, W H Liu (NTU) and T Kaueraul (IMEC) |
Applied Physics Letters. Published in 96, 02903 (2010). |
| Nanoscale Band Gap Spectroscopy on ZnO and GaN-based Components with a Monochromated Electron Microscope |
M Bosman, L J Tang, J D Ye, S T Tan, Y Zhang and V J Keast (The University of Newcastle) |
Applied Physics Letters. Published in 95, 101110 (2009). |
| The Physical Origin of Random Telegraph Noise After Dielectric Breakdown |
X Li (NTU/IME), C H Tung, K L Pey (NTU) and V L Lo (NTU) |
Applied Physics Letters. Published in 94, 132904 (2009) |
| The Radical Distribution of Defects in a Percolation Path |
Li Xiang (NTU/IME), C H Tung, K L Pey (NTU) |
Applied Physics Letters. Published in 93, 262902 (2008). |
